Pentagon Technologies Surface Particle Detector QIII (SM, ST, SX)

  • Instant measurements of surface particulate
  • Improve yield by reducing surface particles
  • Minimize troubleshooting time by quickly identifying particle sources
  • Monitor and set limits for particle density on incoming or outgoing materials
  • Drive continuous improvement through establishing a surface particle baseline
  • Test to standardized ISO 14644-9 classification of surface cleanliness
  • Data integration into SPC systems.
  • BKM Mode Option - to drive consistency in measurements and specifications
  • Capture counted particles for analysis with optional Particle Analysis Module
  • 21 CFR Part 11 Compliance for life- science applications
Model QIII SM QIII ST QIII SX
Particle sensitivity range 0.3µm – 10µm 0.1µm-5µm 5µm-125µm
Channels 0.3, 0.5, 1.0, 3.0, 5.0, 10.0um 0.1, 0.2, 0.3, 1.0, 3.0, 5.0µm 5, 10, 25, 50, 100, 125µm
Sensor Laser Diode
Size & weight 12”Wx10.5”Dx9”H, 18.5lbs 12”Wx12”Dx9”H, 26.5lbs 12”Wx10.5”Dx9”H, 18.5lbs