Pentagon Technologies Surface Particle Detector QIII (SM, ST, SX)
- Instant measurements of surface particulate
- Improve yield by reducing surface particles
- Minimize troubleshooting time by quickly identifying particle sources
- Monitor and set limits for particle density on incoming or outgoing materials
- Drive continuous improvement through establishing a surface particle baseline
- Test to standardized ISO 14644-9 classification of surface cleanliness
- Data integration into SPC systems.
- BKM Mode Option - to drive consistency in measurements and specifications
- Capture counted particles for analysis with optional Particle Analysis Module
- 21 CFR Part 11 Compliance for life- science applications
Model | QIII SM | QIII ST | QIII SX |
---|---|---|---|
Particle sensitivity range | 0.3µm – 10µm | 0.1µm-5µm | 5µm-125µm |
Channels | 0.3, 0.5, 1.0, 3.0, 5.0, 10.0um | 0.1, 0.2, 0.3, 1.0, 3.0, 5.0µm | 5, 10, 25, 50, 100, 125µm |
Sensor | Laser Diode | ||
Size & weight | 12”Wx10.5”Dx9”H, 18.5lbs | 12”Wx12”Dx9”H, 26.5lbs | 12”Wx10.5”Dx9”H, 18.5lbs |