Fastscan and Icon

  • Achieve High Resolution with Confidence — Any Time, Every Time
  • Capture the Most Complete Quantitative Nanoscale Data
  • Unlimited Potential — Fully Flexible with Open Access
  • Surprisingly Simple

https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/dimension-xr/overview.html

 

AFM range of products

https://www.bruker.com/products/surface-and-dimensional-analysis/atomic-force-microscopes/materials-research-afms-atomic-force-microscopes.html