Hanwa Wafer ESD Tester (HED-W5100D)
Auto probe station and wafer mapping program enabled fully automated Wafer-level ESD testing.
CCD camera equipped
Supports up to 12-inch (300mm) wafer.
Can be integrated with Hanwa TLP Tester, HED-T5000 and T5000VF
Woks as high-pin count package-level tester without socket board.
SCM (10pF surge) option is available.