Nikon XTH-225

Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. The entry-level XT H 160 and the versatile XT H 225 systems offer a microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of application of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.