Probe Station

For parametric testing that maximizes the productivity of technicians and engineers in R&D, the Model 4200-SCS Semiconductor Characterization System combines lab-grade DC and pulse device characterization, real-time plotting, and analysis with high precision and sub-femto amp resolution in a fully integrated characterization system. Options include the Model 4210-CVU Capacitance-Voltage Unit, Model 4225-PMU Ultra-Fast I-V Module, Model 4220-PGU Pulse Generator Unit, and Model 4225-RPM Remote Amplifier/Switch.