J-RAS RTm-100 Series
Small resistance measurement of μΩ order
- Scan processing at 50msec/CH enables tracking and pairing with high-speed cycle tests even in multi-channel measurement
- Semiconductor relay for switching 4-terminal network of CH scan, proves long-term reliability
- Built-in AC/ DC source
- Can be expanded up to 240CH, small and lightweight, easy to install and move
- Possible recording and display of temperature data by connecting thermocouple
Uses: Conduction reliability evaluation of through-hole, solder joints and circuit pattern J-RAS RTm-30DC series
