J-RAS Electrochemical Migration (ECM) – 500 Series
- Widely applied voltage of 1V to 500V and individual CH voltage output
- High-speed scan processing of 50msec/CH by installing CH individual measurement circuit
- Leak touch phenomena will be detected using the instantaneous leak current detection circuit with response speed of 100nsec or less
- Housing of up to 100CH is compact and lightweight, easy to relocate and install
- Safety function with emergency or temporary stop
- Realized 130VA energy saving
- Dedicated software that is simple and easy to use
Uses: Migration evaluation of printed circuit boards, solder, resin, insulating materials, etc.
Applied voltage up to 500V supports test requirements of car electronics manufacturers.
