Signatone CM-210 Checkmate 200mm high precision manual Probe Station
Standard Features
- Ultra-stable 50mm thick AI base and Linear Microscope Stage
- Fast and Fine control of DUT X-Y knobs Three - Point Chuck planarization
- Micrometer Driven Chuck Theta-Rotation
- Selectable Pin-Hole Vacuum Zones
- Continuous Platen Lift (CVL) for ease of probe and DUT exchange.
- Fine Platen Lift with lock for DUT/probe setup
- Large Platen (Steel or Aluminum available*)
Product Versatility
- Designed for full or partial wafer probing
- Ultra-Stable solid base for sub-µ probing
- Variable Probe, Chuck, and Microscope configuration
Designed for a Variety of On-Wafer Analytical Measurement Applications
- DC, CV/IV, pulsed –IV applications
- High Power Application up to 12KV /600A
- IC Design / test verification Ambient to +300°C
RF applications up to 110GHz with 2 & 4 port setup P
