Signatone WL-310-LE 300mm Manual RF-DC Probe System with Local Enclosure

For reliable and accurate DC/CV, RF and mmW measurements

Multi-Use

Designed for a wide variety of applications including: Failure Analysis, RF and mmW wafer Level Reliability and Device Characterization

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MAIN SPECIFICATIONS

Local Enclosure for Accurate Measurements

Designed for advanced EMI/ RFI/ Light-Tight shielding
FemtoAmp low-leakage abilities
Accepts temperatures: -60 °C to +300 °C

Ergonomics and Optional Configurations

Easy use of X-Y Stage knobs located in the front –right side of the prober. (away from thermal chuck)
Available in multiple configurations including a variety of chuck options, DC/RF/mmW Micro positioners, microscopes, camera’s, lasers for various applications
Local enclosure included in system configuration

HAST Technology

Learn about the leading technology that drives our machines.

TEMPERATURE

PRESSURE

HUMIDITY

TEST TIME

Competition among manufacturers are heating up. Highly Accelerated Stress Test (HAST) effectively shortens product development time and most importantly, ensure reliability and quality.

HAST can achieve a significant reduction in test time by applying a high temperature and high-pressure load while maintaining the THB test standard of 85% humidity

Reliability Equipment

QA & Metrology

Failure Analysis

Production Tools

Software & Engineering

Test Equipment and Others