Bruker 3D Stylus Profiler Dektak XT
- Revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds, accelerating data collection and analysis
- Implementing a single-arch structure, minimizing the effects of environmental noise. DektakXT’s upgraded “smart electronics” reduce temperature variations and employ modern processors that minimize error-inducing noise, allowing it to be an even more robust system capable of measuring <10nm step heights.
- Self-aligning stylus assembly allows the user to change stylus size quickly and easily while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application need.
- Critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, and materials science industries.
