Bruker Atomic Force Microscope Dimension Icon
- Highest levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry.
- Highest Performance tip scanner: Delivers unmatched large-sample resolution with open-loop noise levels, reduced noise floor, and <200 pm drift rates.
- Versatile open- access platform: Accommodates the widest variety of experiments, modes, techniques, and semi-automated measurements.
- Easy productivity: Provides surprisingly simple setup, intuitive workflow, and fast time to results for publication-quality data every time
