Bruker Atomic Force Microscope Dimension XR
- With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping®, DataCube modes, SECM and AFM-nDMA.
- Hyperspectral nanoelectrical characterization: includes the most complete array or electrical AFM techniques for characterization of functional materials, semiconductors, and energy research
- Sub-100nm electrochemical imaging: Provides the highest resolution, total solution for quantitative analysis of local electrochemical activity associated with batteries, fuel cells, and corrosion.
- Out-of-the-box nanomechanical analysis: Offers fully quantitative, turnkey suite of techniques for correlating structure and nanomechanical properties of materials.
