Bruker XFlash 7T
Element Analysis in Transmission Electron Microscopy on the Nanometer Scale.
- Best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
- Maximum collection and take-off angle allow fast and highly sensitive data acquisition
- Fast-moving stable detector stage
- A special drift correction routine for periodic features ensures successful EDS on the nanoscale
- Time resolved data acquisition for in-situ experiments suitable for saving a stream of changing data, eg. at elevated temperatures
