J-RAS RTm-30DC series

Continuity reliability evaluation equipment RTm-30DC series

  • Possible to measure the resistance value by applying stress to the VIA hole, by applying a large current (3A DC current)
  • Designed with a focus on micro resistance measurement to measure uΩ resistance changes with high resolution
  • Twisted pair cable for each channel effectively reduces noise
  • Compact housing that can be expanded up to 160 channels, easy to install and relocate

Uses: Continuity reliability evaluation under high current stress applied to conductive parts such as via holes and through holes.
The stress current can be arbitrarily set from 0.1A to 3.0A to meet the test requirements of car electronics manufacturers.