Powerful, fully integrated workstation for emission microscopy.

• High quantum efficiency, Mega-pixel CCD detectors in a back-thinned cooled camera designed to produce a portable system that can be interfaced with all analytical probe stations.
• Compact, lightweight modular design allows for unlimited configurations for both packaged and wafer level testing for front and backside emission microscopy applications
• Photo emission detection application: extensive range of photon emitting defects can be easily detected and analyzed with the wide range of PEM 1000 emission microscopes.
  • Forward Biased Junctions.
  • Avalanche Junctions
  • Electrical Overstress-EOS
  • Junction Leakage
  • Oxide Leakage
  • Latch-up
  • Saturated Transistors
  • Hot Electrons
  • Electrostatic Discharge-ESD