Leica EM TXP Trimming & Mechanical Preparation
Target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques.
An integrated stereomicroscope allows pinpointing and easy preparation of barely visible targets.
With the specimen pivot arm the sample can be observed directly at an angle between 0° and 60°, or 90° to the front face for distance determination with an eyepiece graticule.
- Stereomicroscopic target observation during the working process
- Variety of tool inserts allows specimen to be milled, sawn, drilled, ground and polished
- Integrated automatic process control with automatic E-W guiding mechanism, force-regulated feed control and countdown function saves the user from time-consuming routine sample preparation
- Surface finish and target examination with the integrated stereomicroscope means that the user does not have to transfer the sample for distance estimation and surface evaluation, which increases user efficiency.
- Target preparation on surfaced sample for incident light LM and SEM
- Sample thinning for transmitted light LM or prior to ion thinning for TEM
